Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-10398
Il'in, K; Siegel, M; Engel, A; Bartolf, H; Schilling, A; Semenov, A; Hübers, H W (2008). Current-induced critical state in NbN thin-film structures. Journal of Low Temperature Physics, 151(1-2):585-590.
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| Accepted Version 1140Kb |
Abstract
The temperature dependence of the critical current of NbN thin-film bridges was experimentally studied. At low temperatures we observed significant enhancement (up to two times at 4 K) of the critical current density over de-pinning value in the sub-micrometer wide bridges. This enhancement can be described by an increase of the edge barrier for penetration of magnetic vortices into narrow superconducting strips.
| Item Type: | Journal Article, refereed, original work |
|---|---|
| Communities & Collections: | 07 Faculty of Science > Physics Institute |
| DDC: | 530 Physics |
| Language: | English |
| Date: | 2008 |
| Deposited On: | 04 Feb 2009 15:02 |
| Last Modified: | 23 Nov 2012 17:10 |
| Publisher: | Springer |
| ISSN: | 0022-2291 |
| Additional Information: | The original publication is available at www.springerlink.com |
| Publisher DOI: | 10.1007/s10909-007-9690-5 |
| WoS Citation Count: | 3 |
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