Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-10398
Il'in, K; Siegel, M; Engel, A; Bartolf, H; Schilling, A; Semenov, A; Hübers, H W (2008). Current-induced critical state in NbN thin-film structures. Journal of Low Temperature Physics, 151(1-2):585-590.
The temperature dependence of the critical current of NbN thin-film bridges was experimentally studied. At low temperatures we observed significant enhancement (up to two times at 4 K) of the critical current density over de-pinning value in the sub-micrometer wide bridges. This enhancement can be described by an increase of the edge barrier for penetration of magnetic vortices into narrow superconducting strips.
|Item Type:||Journal Article, refereed, original work|
|Communities & Collections:||07 Faculty of Science > Physics Institute|
|Deposited On:||04 Feb 2009 14:02|
|Last Modified:||27 Nov 2013 20:29|
|Additional Information:||The original publication is available at www.springerlink.com|
|Citations:||Web of Science®. Times Cited: 7|
Scopus®. Citation Count: 8
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