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Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-10398

Il'in, K; Siegel, M; Engel, A; Bartolf, H; Schilling, A; Semenov, A; Hübers, H W (2008). Current-induced critical state in NbN thin-film structures. Journal of Low Temperature Physics, 151(1-2):585-590.

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Abstract

The temperature dependence of the critical current of NbN thin-film bridges was experimentally studied. At low temperatures we observed significant enhancement (up to two times at 4 K) of the critical current density over de-pinning value in the sub-micrometer wide bridges. This enhancement can be described by an increase of the edge barrier for penetration of magnetic vortices into narrow superconducting strips.

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
DDC:530 Physics
Language:English
Date:2008
Deposited On:04 Feb 2009 15:02
Last Modified:27 Nov 2013 21:29
Publisher:Springer
ISSN:0022-2291
Additional Information:The original publication is available at www.springerlink.com
Publisher DOI:10.1007/s10909-007-9690-5
Citations:Web of Science®. Times Cited: 7
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