Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-10398
Il'in, K; Siegel, M; Engel, A; Bartolf, H; Schilling, A; Semenov, A; Hübers, H W (2008). Current-induced critical state in NbN thin-film structures. Journal of Low Temperature Physics, 151(1-2):585-590.
View at publisher
The temperature dependence of the critical current of NbN thin-film bridges was experimentally studied. At low temperatures we observed significant enhancement (up to two times at 4 K) of the critical current density over de-pinning value in the sub-micrometer wide bridges. This enhancement can be described by an increase of the edge barrier for penetration of magnetic vortices into narrow superconducting strips.
65 downloads since deposited on 04 Feb 2009
10 downloads since 12 months
|Item Type:||Journal Article, refereed, original work|
|Communities & Collections:||07 Faculty of Science > Physics Institute|
|Dewey Decimal Classification:||530 Physics|
|Deposited On:||04 Feb 2009 14:02|
|Last Modified:||27 Nov 2013 20:29|
|Additional Information:||The original publication is available at www.springerlink.com|
Users (please log in): suggest update or correction for this item
Repository Staff Only: item control page