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Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-26918

Marone, F; Hintermüller, C; McDonald, S; Abela, R; Mikuljan, G; Isenegger, A; Stampanoni, M (2009). Broadband X-ray full field microscopy at a superbend. Journal of Physics: Conference Series, 186:012018.



Over the last decade, synchrotron-radiation based X-ray Tomographic Microscopy
(SRXTM) has established itself as a fundamental tool for non-invasive, quantitative
investigations of a broad variety of samples, with application ranging from space research and
materials science to biology and medicine. The beamline for TOmographic Microscopy and
Coherent rAdiology experimenTs (TOMCAT) has been recently equipped with a full field, hard
X-ray microscope with a theoretical pixel size down to 30 nm and a field of view of 50 microns.
The nanoscope performs well at X-ray energies between 8 and 12 keV: here we illustrate the
experimental setup and the performance of the instrument in both microscopy and tomography

Item Type:Journal Article, refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
DDC:170 Ethics
610 Medicine & health
Deposited On:22 Jan 2010 15:29
Last Modified:23 Nov 2012 14:36
Publisher:Institute of Physics Publishing
Publisher DOI:10.1088/1742-6596/186/1/012018
Other Identification Number:10.1088/1742-6596/186/1/012018
Citations:Google Scholar™
Scopus®. Citation Count: 4

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