Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-3096
Noetzli, J; Gruber, S; Hilbich, C; Hoelzle, M; Hauck, C; Krauer, M (2008). Comparison of simulated 2D temperature profiles with time-lapse electrical resistivity data at the Schilthorn Crest, Switzerland. In: 9th International Conference on Permafrost, Fairbanks, Alaska, 29 June 2008 - 03 July 2008, 1293-1298.
The Schilthorn Crest in the Bernese Alps, Switzerland, is a prominent permafrost research site. Topographic and
transient effects influence the temperature field below the east-west oriented crest. Measured T(z)-profiles in boreholes, however, do not provide sufficient information for a comprehensive description of the subsurface temperature distribution. We combine ground temperature measurements, electric resistivity tomography (ERT) monitoring, and numerical modeling to investigate the 3-dimensional thermal regime below the crest. The modeled temperature field of a north-south oriented cross section agrees well with ERT results along the same profile. The simulated thermal regime below the Schilthorn is characterized by generally warm permafrost, with the coldest zone below the upper part of the north-facing slope, and permafrost a little below the surface on the south-facing slope. The combination of temperature modeling and measurements and geophysical monitoring bears potential to improve simulation and validation strategies.
|Item Type:||Conference or Workshop Item (Paper), refereed, original work|
|Communities & Collections:||07 Faculty of Science > Institute of Geography|
|DDC:||910 Geography & travel|
|Event End Date:||03 July 2008|
|Deposited On:||24 Oct 2008 09:31|
|Last Modified:||09 Jul 2012 05:18|
|Related URLs:||http://www.nicop.org/ (Organisation)|
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