Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-43612
Winterflood, C M; Ruckstuhl, T; Verdes, D; Seeger, S (2010). Nanometer axial resolution by three-dimensional supercritical angle fluorescence microscopy. Physical Review Letters, 105(10):108103.
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We report a noninvasive fluorescence microscopy method and demonstrate nanometer resolution along the optical axis. The technique is based on the influence of the microscope slide on the angular intensity distribution of fluorescence. Axial positions are determined by measuring the proportion of light emitted below the critical angle of total internal reflection, which behaves in a classical way, and light emitted above the critical angle, which is exponentially dependent on the distance of the fluorophore from the microscope slide.
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|Item Type:||Journal Article, refereed, original work|
|Communities & Collections:||07 Faculty of Science > Department of Chemistry|
|Dewey Decimal Classification:||540 Chemistry|
|Deposited On:||16 Feb 2011 18:58|
|Last Modified:||05 Jun 2014 15:34|
|Publisher:||American Physical Society|
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