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Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-43717

Stampanoni, M; Marone, F; Modregger, P; Pinzer, B; Thüring, T; Vila-Comamala, J; David, C; Mokso, R (2010). Tomographic Hard X-ray Phase Contrast Micro- and Nano-imaging at TOMCAT. In: 6th international conference on medical applications of synchrotron radiation, Melbourne, Australia, 23 July 2010 - 23 July 2010, 13-17.

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Abstract

This article illustrates the phase contrast instrumentation installed at the Tomographic Microscopy and Coherent Radiology beamline (TOMCAT) of the Swiss Light Source. Our experimental framework has been designed to extract phase information at spatial resolutions covering three orders of magnitude. For moderate (5-10 microns) resolutions we implemented a two-gratings interferometer, operated at energies between 14 and 40 keV. For high resolution (1-5 microns) we obtain phase information thanks to a modified transport of intensity approach. For very high-resolutions (0.1-0.5 microns) we developed a broadband hard X-ray full-field microscope operated in Zernike-phase contrast.

Item Type:Conference or Workshop Item (Paper), refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
DDC:170 Ethics
610 Medicine & health
Language:English
Event End Date:23 July 2010
Deposited On:27 Jan 2011 16:36
Last Modified:28 Dec 2013 13:14
ISSN:0094-243X (P) 1551-7616 (E)
Additional Information:AIP Conference Proceedings
Publisher DOI:10.1063/1.3478189
Related URLs:http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=APCPCS001266000001000013000001&idtype=cvips&gifs=yes (Publisher)
Citations:Web of Science®. Times Cited: 8
Google Scholar™
Scopus®. Citation Count: 5

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