Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-43717
Stampanoni, M; Marone, F; Modregger, P; Pinzer, B; Thüring, T; Vila-Comamala, J; David, C; Mokso, R (2010). Tomographic Hard X-ray Phase Contrast Micro- and Nano-imaging at TOMCAT. In: 6th international conference on medical applications of synchrotron radiation, Melbourne, Australia, 23 July 2010 - 23 July 2010, 13-17.
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This article illustrates the phase contrast instrumentation installed at the Tomographic Microscopy and Coherent Radiology beamline (TOMCAT) of the Swiss Light Source. Our experimental framework has been designed to extract phase information at spatial resolutions covering three orders of magnitude. For moderate (5-10 microns) resolutions we implemented a two-gratings interferometer, operated at energies between 14 and 40 keV. For high resolution (1-5 microns) we obtain phase information thanks to a modified transport of intensity approach. For very high-resolutions (0.1-0.5 microns) we developed a broadband hard X-ray full-field microscope operated in Zernike-phase contrast.
|Item Type:||Conference or Workshop Item (Paper), refereed, original work|
|Communities & Collections:||04 Faculty of Medicine > Institute of Biomedical Engineering|
610 Medicine & health
|Event End Date:||23 July 2010|
|Deposited On:||27 Jan 2011 17:36|
|Last Modified:||28 Nov 2013 00:57|
|ISSN:||0094-243X (P) 1551-7616 (E)|
|Additional Information:||AIP Conference Proceedings|
|Related URLs:||http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=APCPCS001266000001000013000001&idtype=cvips&gifs=yes (Publisher)|
|Citations:||Web of Science®. Times cited: 5|
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