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Stampanoni, M; Mokso, R; Marone, F; Vila-Comamala, J; Gorelick, S; Trtik, P; Jefimovs, K; David, C (2010). Phase-contrast tomography at the nanoscale using hard x rays. Physical Review B, 81(14):140105.

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Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with an isotropic resolution of 144 nm. Custom-designed optical components allow for ideal, aperture-matched sample illumination and very sensitive phase contrast imaging. We show here that the instrument has been successfully used for the nondestructive, volumetric investigation of single cells.


42 citations in Web of Science®
39 citations in Scopus®
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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
Dewey Decimal Classification:170 Ethics
610 Medicine & health
Deposited On:27 Jan 2011 16:31
Last Modified:27 Nov 2013 19:07
Publisher:American Physical Society
Free access at:Publisher DOI. An embargo period may apply.
Publisher DOI:10.1103/PhysRevB.81.140105

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