Stampanoni, M; Mokso, R; Marone, F; Vila-Comamala, J; Gorelick, S; Trtik, P; Jefimovs, K; David, C (2010). Phase-contrast tomography at the nanoscale using hard x rays. Physical Review B, 81(14):140105.
Full text not available from this repository.
View at publisher
Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with an isotropic resolution of 144 nm. Custom-designed optical components allow for ideal, aperture-matched sample illumination and very sensitive phase contrast imaging. We show here that the instrument has been successfully used for the nondestructive, volumetric investigation of single cells.
|Item Type:||Journal Article, refereed, original work|
|Communities & Collections:||04 Faculty of Medicine > Institute of Biomedical Engineering|
|Dewey Decimal Classification:||170 Ethics
610 Medicine & health
|Deposited On:||27 Jan 2011 16:31|
|Last Modified:||05 Apr 2016 14:40|
|Publisher:||American Physical Society|
|Free access at:||Publisher DOI. An embargo period may apply.|
Users (please log in): suggest update or correction for this item
Repository Staff Only: item control page