Stampanoni, M; Mokso, R; Marone, F; Vila-Comamala, J; Gorelick, S; Trtik, P; Jefimovs, K; David, C (2010). Phase-contrast tomography at the nanoscale using hard x rays. Physical Review B, 81(14):140105.
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Abstract
Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with an isotropic resolution of 144 nm. Custom-designed optical components allow for ideal, aperture-matched sample illumination and very sensitive phase contrast imaging. We show here that the instrument has been successfully used for the nondestructive, volumetric investigation of single cells.
| Item Type: | Journal Article, refereed, original work |
|---|---|
| Communities & Collections: | 04 Faculty of Medicine > Institute of Biomedical Engineering |
| DDC: | 170 Ethics 610 Medicine & health |
| Language: | English |
| Date: | 2010 |
| Deposited On: | 27 Jan 2011 17:31 |
| Last Modified: | 23 Nov 2012 15:10 |
| Publisher: | American Physical Society |
| ISSN: | 1098-0121 |
| Free access at: | Publisher DOI. An embargo period may apply. |
| Publisher DOI: | 10.1103/PhysRevB.81.140105 |
| WoS Citation Count: | 17 |
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