Quick Search:

uzh logo
Browse by:

Zurich Open Repository and Archive 

Stampanoni, M; Mokso, R; Marone, F; Vila-Comamala, J; Gorelick, S; Trtik, P; Jefimovs, K; David, C (2010). Phase-contrast tomography at the nanoscale using hard x rays. Physical Review B, 81(14):140105.

Full text not available from this repository.


Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with an isotropic resolution of 144 nm. Custom-designed optical components allow for ideal, aperture-matched sample illumination and very sensitive phase contrast imaging. We show here that the instrument has been successfully used for the nondestructive, volumetric investigation of single cells.

Item Type:Journal Article, refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
DDC:170 Ethics
610 Medicine & health
Deposited On:27 Jan 2011 16:31
Last Modified:27 Nov 2013 19:07
Publisher:American Physical Society
Free access at:Publisher DOI. An embargo period may apply.
Publisher DOI:10.1103/PhysRevB.81.140105
Citations:Web of Science®. Times Cited: 31
Google Scholar™
Scopus®. Citation Count: 26

Users (please log in): suggest update or correction for this item

Repository Staff Only: item control page