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Artifacts in X-ray Dark-Field Tomography


Modregger, P; Wang, Z; Thuering, T; Pinzer, B; Stampanoni, M (2010). Artifacts in X-ray Dark-Field Tomography. In: The 10th International Conference on X-ray Microscopy, Chicago, Illinois, (USA), 15 August 2010 - 20 August 2010, 269-272.

Abstract

Grating-based x-ray imaging provides three principle kinds of contrast: absorption, phase, and dark-field. Due to the availability of tomographic reconstruction algorithms for the dark-field contrast, it is now possible to take advantage of quantitative scatter information. However, the published algorithm is based on several assumptions that might be violated in reality. We use numerical simulations in order to identify artifacts in the reconstructions, which is crucial for the interpretation of experimental data.

Grating-based x-ray imaging provides three principle kinds of contrast: absorption, phase, and dark-field. Due to the availability of tomographic reconstruction algorithms for the dark-field contrast, it is now possible to take advantage of quantitative scatter information. However, the published algorithm is based on several assumptions that might be violated in reality. We use numerical simulations in order to identify artifacts in the reconstructions, which is crucial for the interpretation of experimental data.

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3 citations in Web of Science®
3 citations in Scopus®
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Additional indexing

Item Type:Conference or Workshop Item (Speech), refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
Dewey Decimal Classification:170 Ethics
610 Medicine & health
Language:English
Event End Date:20 August 2010
Deposited On:30 Apr 2012 15:01
Last Modified:19 May 2016 14:21
Publisher:American Institute of Physics
Series Name:AIP Conference Proceedings
Number:1365
ISSN:0094-243X
ISBN:978-0-7354-0925-5
Free access at:Publisher DOI. An embargo period may apply.
Publisher DOI:https://doi.org/10.1063/1.3625356
Permanent URL: https://doi.org/10.5167/uzh-57645

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