Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-57645
Modregger, P; Wang, Z; Thuering, T; Pinzer, B; Stampanoni, M (2010). Artifacts in X-ray Dark-Field Tomography. In: The 10th International Conference on X-ray Microscopy, Chicago, Illinois, (USA), 15 August 2010 - 20 August 2010, 269-272.
Grating-based x-ray imaging provides three principle kinds of contrast: absorption, phase, and dark-field. Due to the availability of tomographic reconstruction algorithms for the dark-field contrast, it is now possible to take advantage of quantitative scatter information. However, the published algorithm is based on several assumptions that might be violated in reality. We use numerical simulations in order to identify artifacts in the reconstructions, which is crucial for the interpretation of experimental data.
|Item Type:||Conference or Workshop Item (Speech), refereed, original work|
|Communities & Collections:||04 Faculty of Medicine > Institute of Biomedical Engineering|
610 Medicine & health
|Event End Date:||20 August 2010|
|Deposited On:||30 Apr 2012 15:01|
|Last Modified:||04 Dec 2013 18:01|
|Publisher:||American Institute of Physics|
|Series Name:||AIP Conference Proceedings|
|Citations:||Web of Science®. Times Cited: 1|
Scopus®. Citation Count: 1
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