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Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-57655

Marone, F; Mokso, R; Modregger, P; Fife, J; Pinzer, B; Thüring, T; Mader, K; Mikuljan, G; Isenegger, A; Stampanoni, M (2010). Present and Future X-ray Tomographic Microscopy at TOMCAT. In: 10th International Conference on X-Ray Microscopy, Chicago, Illinois, (USA), 15 August 2010 - 20 August 2010, 116-119.

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During its first four years of life, the TOMCAT beamline [1] at the Swiss Light Source has established itself as a state‐of‐the art hard x‐ray tomographic microscopy endstation for experiments on a large variety of samples, ranging from the fields of biology to materials science. It routinely performs absorption as well as phase‐contrast imaging with an isotropic voxel size ranging from 0.360 up to 14.8 microns. Phase contrast is obtained either with simple edge‐enhancement, a modified transport of intensity approach [2] or grating interferometry [3]. Typical acquisition times are on the order of a few minutes, depending on energy and resolution. A recently implemented automatic sample exchanger is now available for high‐throughput studies [4]. In addition to further developments in phase‐contrast imaging, current scientific activities at the beamline focus on pushing spatial and temporal resolution by a few orders of magnitude, aiming at nano‐ [5] and “real‐time” [6] tomography.


3 citations in Web of Science®
2 citations in Scopus®
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Additional indexing

Item Type:Conference or Workshop Item (Speech), refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
Dewey Decimal Classification:170 Ethics
610 Medicine & health
Event End Date:20 August 2010
Deposited On:20 Mar 2012 12:38
Last Modified:13 Jun 2016 07:55
Publisher:American Institute of Physics
Series Name:AIP Conference Proceedings
Additional Information:AIP Conf. Proc. 1365, pp. 116-119; doi:http://dx.doi.org/10.1063/1.3625318
Free access at:Publisher DOI. An embargo period may apply.
Publisher DOI:10.1063/1.3625318

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