Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-57657
Stampanoni, M; Marone, F; Vila-Comamala, J; Gorelick, S; David, C; Trtik, P; Jefimovs, K; Mokso, R (2010). Hard X-ray Phase-Contrast Tomographic Nanoimaging. In: 10th International Conference on X-Ray Microscopy, Chicago, Illinois, (USA), 15 August 2010 - 20 August 2010, 239-242.
|Published Version (English)|
Synchrotron‐based full‐field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100‐nm barrier is reached and trespassed only by few instruments, mainly in the soft x‐ray regime. We present an x‐ray, full‐field microscope with tomographic capabilities operating at 10 keV and with a 3D isotropic resolution of 144 nm recently installed at the TOMCAT beamline of the Swiss Light Source. Custom optical components, including a beam‐shaping condenser and phase‐shifting dot arrays, were used to obtain an ideal, aperture‐matched sample illumination and very sensitive phase‐contrast imaging. The instrument has been successfully used for the nondestructive, volumetric investigation of single, unstained cells.
|Item Type:||Conference or Workshop Item (Speech), refereed, original work|
|Communities & Collections:||04 Faculty of Medicine > Institute of Biomedical Engineering|
610 Medicine & health
|Event End Date:||20 August 2010|
|Deposited On:||20 Mar 2012 13:43|
|Last Modified:||02 Dec 2012 08:23|
|Publisher:||American Institute of Physics|
|Series Name:||AIP Conference Proceedings|
|Additional Information:||AIP Conf. Proc. 1365, pp. 239-242; doi:http://dx.doi.org/10.1063/1.3625348|
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