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Permanent URL to this publication: http://dx.doi.org/10.5167/uzh-57657

Stampanoni, M; Marone, F; Vila-Comamala, J; Gorelick, S; David, C; Trtik, P; Jefimovs, K; Mokso, R (2010). Hard X-ray Phase-Contrast Tomographic Nanoimaging. In: 10th International Conference on X-Ray Microscopy, Chicago, Illinois, (USA), 15 August 2010 - 20 August 2010, 239-242.

Published Version (English)


Synchrotron‐based full‐field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100‐nm barrier is reached and trespassed only by few instruments, mainly in the soft x‐ray regime. We present an x‐ray, full‐field microscope with tomographic capabilities operating at 10 keV and with a 3D isotropic resolution of 144 nm recently installed at the TOMCAT beamline of the Swiss Light Source. Custom optical components, including a beam‐shaping condenser and phase‐shifting dot arrays, were used to obtain an ideal, aperture‐matched sample illumination and very sensitive phase‐contrast imaging. The instrument has been successfully used for the nondestructive, volumetric investigation of single, unstained cells.

Item Type:Conference or Workshop Item (Speech), refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
DDC:170 Ethics
610 Medicine & health
Event End Date:20 August 2010
Deposited On:20 Mar 2012 12:43
Last Modified:14 Dec 2013 23:17
Publisher:American Institute of Physics
Series Name:AIP Conference Proceedings
Additional Information:AIP Conf. Proc. 1365, pp. 239-242; doi:http://dx.doi.org/10.1063/1.3625348
Publisher DOI:10.1063/1.3625348
Citations:Web of Science®
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