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We present novel modified lift-off processes for the fabrication of large-area, uniform metal nanowire arrays. In all processes, dense line arrays with periods in the 50–100 nm range were obtained in photoresist films with Extreme Ultraviolet Interference Lithography (EUV-IL). The critical problem of preparing lift-off masks with a negative resist profile is solved by the use of either a bilayer resist stack of HSQ/PMMA or deposition of a metal layer at oblique angles on top of the patterned resist lines. As an added benefit, the metal deposition step enables fine-tuning of the width of the nanowires. Using the developed processes, Au and Cr nanowires with 8 nm–70 nm linewidth were obtained.
|Item Type:||Journal Article, refereed, original work|
|Communities & Collections:||04 Faculty of Medicine > Institute of Biomedical Engineering|
610 Medicine & health
|Deposited On:||06 Jan 2009 11:57|
|Last Modified:||27 Nov 2013 22:45|
|Other Identification Number:|
|Citations:||Web of Science®. Times Cited: 20|
Scopus®. Citation Count: 23
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