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Low cost photoelectron yield setup for surface process monitoring


Hemmi, Adrian; Cun, Huanyao; Roth, Silvan; Osterwalder, Jürg; Greber, Thomas (2014). Low cost photoelectron yield setup for surface process monitoring. Journal of Vacuum Science & Technology A, 32(2):023202.

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Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Language:English
Date:2014
Deposited On:13 Feb 2015 15:20
Last Modified:21 Nov 2017 17:45
Publisher:American Institute of Physics
ISSN:0734-2101
Free access at:Publisher DOI. An embargo period may apply.
Publisher DOI:https://doi.org/10.1116/1.4866095

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