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Ultrafast charge carrier recombination and trapping in hematite photoanodes under applied bias


Pendlebury, Stephanie R; Wang, Xiuli; Le Formal, Florian; Cornuz, Maurin; Kafizas, Andreas; Tilley, S David; Grätzel, Michael; Durrant, James R (2014). Ultrafast charge carrier recombination and trapping in hematite photoanodes under applied bias. Journal of the American Chemical Society, 136(28):9854-9857.

Abstract

Transient absorption spectroscopy on subpicosecond to second time scales is used to investigate photogenerated charge carrier recombination in Si-doped nanostructured hematite (α-Fe2O3) photoanodes as a function of applied bias. For unbiased hematite, this recombination exhibits a 50% decay time of ~6 ps, ~10(3) times faster than that of TiO2 under comparable conditions. Anodic bias significantly retards hematite recombination dynamics, and causes the appearance of electron trapping on ps-μs time scales. These ultrafast recombination dynamics, their retardation by applied bias, and the associated electron trapping are discussed in terms of their implications for efficient water oxidation.

Abstract

Transient absorption spectroscopy on subpicosecond to second time scales is used to investigate photogenerated charge carrier recombination in Si-doped nanostructured hematite (α-Fe2O3) photoanodes as a function of applied bias. For unbiased hematite, this recombination exhibits a 50% decay time of ~6 ps, ~10(3) times faster than that of TiO2 under comparable conditions. Anodic bias significantly retards hematite recombination dynamics, and causes the appearance of electron trapping on ps-μs time scales. These ultrafast recombination dynamics, their retardation by applied bias, and the associated electron trapping are discussed in terms of their implications for efficient water oxidation.

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Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Department of Chemistry
Dewey Decimal Classification:540 Chemistry
Language:English
Date:2014
Deposited On:27 May 2015 15:28
Last Modified:07 Aug 2017 01:38
Publisher:American Chemical Society (ACS)
ISSN:0002-7863
Free access at:PubMed ID. An embargo period may apply.
Publisher DOI:https://doi.org/10.1021/ja504473e
PubMed ID:24950057

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