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Fully polarimetric high-resolution airborne SAR image change detection with morphological component analysis


Mendez Dominguez, Elias; Henke, Daniel; Small, David; Meier, Erich (2015). Fully polarimetric high-resolution airborne SAR image change detection with morphological component analysis. In: SPIE Remote Sensing, Toulouse, France, 21 September 2015 - 24 September 2015, 964312.

Abstract

Change detection for high resolution Synthetic Aperture Radar (SAR) imagery requires advanced denoising mechanisms to preserve details and minimize speckle. In this work, we propose a change detector based on a Morphological Component Analysis (MCA) of the scattering mechanisms provided with fully polarimetric data sets. With MCA, the power of each scattering mechanism is decomposed into diverse image features. By introducing a priori knowledge of the content of the scenes, and exploiting both the scattering mechanisms and their corresponding shapes, we can significantly improve performance, with fewer false alarms introduced by clutter, focusing errors, and inconsistent acquisition geometries.

Abstract

Change detection for high resolution Synthetic Aperture Radar (SAR) imagery requires advanced denoising mechanisms to preserve details and minimize speckle. In this work, we propose a change detector based on a Morphological Component Analysis (MCA) of the scattering mechanisms provided with fully polarimetric data sets. With MCA, the power of each scattering mechanism is decomposed into diverse image features. By introducing a priori knowledge of the content of the scenes, and exploiting both the scattering mechanisms and their corresponding shapes, we can significantly improve performance, with fewer false alarms introduced by clutter, focusing errors, and inconsistent acquisition geometries.

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Additional indexing

Item Type:Conference or Workshop Item (Paper), refereed, original work
Communities & Collections:07 Faculty of Science > Institute of Geography
Dewey Decimal Classification:910 Geography & travel
Language:English
Event End Date:24 September 2015
Deposited On:18 Dec 2015 11:55
Last Modified:08 Dec 2017 16:04
Publisher:SPIE - International Society for Optical Engineering
Series Name:Proceedings of SPIE
ISSN:0277-786X
Publisher DOI:https://doi.org/10.1117/12.2194780

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