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Study of the signal response of the MÖNCH 25μm pitch hybrid pixel detector at different photon absorption depths


Cartier, S; Bergamaschi, A; Dinapoli, R; Greiffenberg, D; Johnson, I; Jungmann-Smith, J H; Mezza, D; Mozzanica, A; Shi, X; Tinti, G; Schmitt, B; Stampanoni, M (2015). Study of the signal response of the MÖNCH 25μm pitch hybrid pixel detector at different photon absorption depths. Journal of Instrumentation, 10(03):C03022-C03022.

Abstract

MÖNCH is a 25 μm pitch hybrid silicon pixel detector with a charge integrating analog read-out front-end in each pixel. The small pixel size brings new challenges in bump-bonding, power consumption and chip design. The MÖNCH02 prototype ASIC, manufactured in UMC 110 nm technology with a field of view of 4×4 mm2 and 160×160 pixels, has been characterized in the single photon regime, i.e. with less than one photon acquired per frame on average on a 3×3 pixel cluster. The low noise and small pixel size allow spatial interpolation with high resolution.
Understanding charge sharing as a function of the photon absorption depth and sensor bias is a key for optimal processing of single photon data for high resolution imaging. To characterize the charge collection of the detector, the sensor was illuminated with a 20 keV photon beam in edge-on configuration at the SYRMEP beamline of Elettra. By slicing the beam by means of a 5 μm slit and scanning through the 320 μm silicon sensor depth, the charge collection is characterized as a function of the photon absorption depth for different sensor bias voltages.

Abstract

MÖNCH is a 25 μm pitch hybrid silicon pixel detector with a charge integrating analog read-out front-end in each pixel. The small pixel size brings new challenges in bump-bonding, power consumption and chip design. The MÖNCH02 prototype ASIC, manufactured in UMC 110 nm technology with a field of view of 4×4 mm2 and 160×160 pixels, has been characterized in the single photon regime, i.e. with less than one photon acquired per frame on average on a 3×3 pixel cluster. The low noise and small pixel size allow spatial interpolation with high resolution.
Understanding charge sharing as a function of the photon absorption depth and sensor bias is a key for optimal processing of single photon data for high resolution imaging. To characterize the charge collection of the detector, the sensor was illuminated with a 20 keV photon beam in edge-on configuration at the SYRMEP beamline of Elettra. By slicing the beam by means of a 5 μm slit and scanning through the 320 μm silicon sensor depth, the charge collection is characterized as a function of the photon absorption depth for different sensor bias voltages.

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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
Dewey Decimal Classification:170 Ethics
610 Medicine & health
Language:English
Date:2015
Deposited On:08 Feb 2016 15:29
Last Modified:05 Apr 2016 20:00
Publisher:IOP Publishing
ISSN:1748-0221
Publisher DOI:https://doi.org/10.1088/1748-0221/10/03/C03022

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