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Xylem characterization using improved pseudo-Schiff propidium iodide staining of whole mount samples and confocal laser-scanning microscopy


Coiro, Mario; Truernit, Elisabeth (2017). Xylem characterization using improved pseudo-Schiff propidium iodide staining of whole mount samples and confocal laser-scanning microscopy. In: de Lucas, Miguel; Etchells, J Peter. Xylem. New York: Springer, 127-132.

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Item Type:Book Section, refereed, original work
Communities & Collections:07 Faculty of Science > Department of Systematic and Evolutionary Botany
07 Faculty of Science > Zurich-Basel Plant Science Center
Dewey Decimal Classification:580 Plants (Botany)
Language:English
Date:2017
Deposited On:12 Jan 2017 14:28
Last Modified:19 Feb 2018 07:31
Publisher:Springer
Series Name:Methods in Molecular Biology
ISSN:1064-3745
ISBN:978-1-4939-6720-9
OA Status:Closed
Publisher DOI:https://doi.org/10.1007/978-1-4939-6722-3_11

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