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Decoding of MDP convolutional codes over the erasure channel


Tomás, V; Rosenthal, J; Smarandache, R (2009). Decoding of MDP convolutional codes over the erasure channel. In: IEEE. 2009 IEEE International Symposium on Information Theory, ISIT 2009, Seoul, Korea, 28 June - 03 July 2009. New York, US: Institute of Electrical and Electronics Engineer, 556-560.

Abstract

This paper studies the decoding capabilities of maximum distance profile (MDP) convolutional codes over the erasure channel and compares them with the decoding capabilities of MDS block codes over the same channel. The erasure channel involving large alphabets is an important practical channel model when studying packet transmissions over a network, e.g, the Internet.

Abstract

This paper studies the decoding capabilities of maximum distance profile (MDP) convolutional codes over the erasure channel and compares them with the decoding capabilities of MDS block codes over the same channel. The erasure channel involving large alphabets is an important practical channel model when studying packet transmissions over a network, e.g, the Internet.

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Additional indexing

Item Type:Book Section, refereed, original work
Communities & Collections:07 Faculty of Science > Institute of Mathematics
Dewey Decimal Classification:510 Mathematics
Language:English
Date:2009
Deposited On:13 Mar 2010 11:59
Last Modified:05 Apr 2016 13:51
Publisher:Institute of Electrical and Electronics Engineer
Series Name:IEEE International Symposium on Information Theory. Proceedings
ISSN:0271-4655
ISBN:978-1-4244-4312-3 (P) 978-1-4244-4313-0 (E)
Additional Information:© 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Publisher DOI:https://doi.org/10.1109/ISIT.2009.5205686
Related URLs:http://ieeexplore.ieee.org (Publisher)

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