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Probing the length, path, and charge displacement of voltage sensor S4 in ion channels during gating


Gamal El-Din, T M. Probing the length, path, and charge displacement of voltage sensor S4 in ion channels during gating. 2009, University of Zurich, Faculty of Science.

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Item Type:Dissertation
Referees:Fink H W, Greeff N, Helmchen F
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Language:English
Date:2009
Deposited On:12 Mar 2010 08:58
Last Modified:05 Apr 2016 14:03

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