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Influence of thickness, width and temperature on critical current density of Nb thin film structures


Il’in, K; Rall, D; Siegel, M; Engel, A; Schilling, A; Semenov, A; Huebers, H W (2010). Influence of thickness, width and temperature on critical current density of Nb thin film structures. Physica C: Superconductivity, 470(19):953-956.

Abstract

The density of critical currents jC in Nb thin films with thickness smaller than 15 nm and width between 100 nm and 10 μm has been measured in a wide temperature range. We have found that the temperature dependencies of jC in sub-micrometer wide bridges at 0.7TC < T < TC are well described by the Ginzburg–Landau de-pairing critical current. In wider bridges already at T < 0.9TC the jC value is significantly reduced due to the penetration and de-pinning of magnetic vortices.

Abstract

The density of critical currents jC in Nb thin films with thickness smaller than 15 nm and width between 100 nm and 10 μm has been measured in a wide temperature range. We have found that the temperature dependencies of jC in sub-micrometer wide bridges at 0.7TC < T < TC are well described by the Ginzburg–Landau de-pairing critical current. In wider bridges already at T < 0.9TC the jC value is significantly reduced due to the penetration and de-pinning of magnetic vortices.

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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Language:English
Date:2010
Deposited On:13 Feb 2011 18:55
Last Modified:07 Dec 2017 06:00
Publisher:Elsevier
ISSN:0921-4534
Publisher DOI:https://doi.org/10.1016/j.physc.2010.02.042

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