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Nanometer axial resolution by three-dimensional supercritical angle fluorescence microscopy


Winterflood, C M; Ruckstuhl, T; Verdes, D; Seeger, S (2010). Nanometer axial resolution by three-dimensional supercritical angle fluorescence microscopy. Physical Review Letters, 105(10):108103.

Abstract

We report a noninvasive fluorescence microscopy method and demonstrate nanometer resolution along the optical axis. The technique is based on the influence of the microscope slide on the angular intensity distribution of fluorescence. Axial positions are determined by measuring the proportion of light emitted below the critical angle of total internal reflection, which behaves in a classical way, and light emitted above the critical angle, which is exponentially dependent on the distance of the fluorophore from the
microscope slide.

Abstract

We report a noninvasive fluorescence microscopy method and demonstrate nanometer resolution along the optical axis. The technique is based on the influence of the microscope slide on the angular intensity distribution of fluorescence. Axial positions are determined by measuring the proportion of light emitted below the critical angle of total internal reflection, which behaves in a classical way, and light emitted above the critical angle, which is exponentially dependent on the distance of the fluorophore from the
microscope slide.

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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Department of Chemistry
Dewey Decimal Classification:540 Chemistry
Language:English
Date:2010
Deposited On:16 Feb 2011 18:58
Last Modified:09 Mar 2017 08:40
Publisher:American Physical Society
ISSN:0031-9007
Publisher DOI:https://doi.org/10.1103/PhysRevLett.105.108103
PubMed ID:20867551

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