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Pixel detector data quality monitoring in CMS


Rose, K; Blekman, F; Chiochia, V; Gomez-Ceballos, S H C; Merkel, P (2010). Pixel detector data quality monitoring in CMS. Journal of Physics: Conference Series, 219(3):032056.

Abstract

The silicon pixel detector in the Compact Muon Solenoid (CMS) at the Large Hadron Collider contains approximately 66 million channels, and will provide extremely high tracking resolution for the experiment. To ensure the data collected is valid, it must be monitored continuously at all levels of acquisition and reconstruction. The Pixel Data Quality Monitoring (DQM) process ensures that the detector, as well as the data acquisition and reconstruction chain, is functioning properly. The monitoring process is designed such that it can examine the pixel detector with high enough granularity that potential problems can be identified and isolated, while running efficiently enough that action can be taken before much data is compromised.

Abstract

The silicon pixel detector in the Compact Muon Solenoid (CMS) at the Large Hadron Collider contains approximately 66 million channels, and will provide extremely high tracking resolution for the experiment. To ensure the data collected is valid, it must be monitored continuously at all levels of acquisition and reconstruction. The Pixel Data Quality Monitoring (DQM) process ensures that the detector, as well as the data acquisition and reconstruction chain, is functioning properly. The monitoring process is designed such that it can examine the pixel detector with high enough granularity that potential problems can be identified and isolated, while running efficiently enough that action can be taken before much data is compromised.

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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Language:English
Date:2010
Deposited On:13 Feb 2011 16:01
Last Modified:07 Dec 2017 07:13
Publisher:Institute of Physics Publishing
ISSN:1742-6588
Publisher DOI:https://doi.org/10.1088/1742-6596/219/3/032056

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