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Synchrotron-based X-ray tomographic microscopy at the Swiss light source for industrial applications


Marone, F; Mokso, R; Fife, J L; Irvine, S; Modregger, P; Pinzer, B R; Mader, K; Isenegger, A; Mikuljan, G; Stampanoni, M (2011). Synchrotron-based X-ray tomographic microscopy at the Swiss light source for industrial applications. Synchrotron Radiation News, 24(6):24-29.

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Item Type:Journal Article, refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
Dewey Decimal Classification:170 Ethics
610 Medicine & health
Language:English
Date:2011
Deposited On:28 Jan 2012 14:24
Last Modified:05 Apr 2016 15:28
Publisher:Taylor & Francis
ISSN:0894-0886
Publisher DOI:https://doi.org/10.1080/08940886.2011.634315

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