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Multiorder correction algorithms to remove image distortions from mass spectrometry imaging data sets


Basler, Konrad; Brunner, Erich; Eijkel, Gert B; Furrer, Reinhard; Gerber, Florian; Heeren, Rom M A (2013). Multiorder correction algorithms to remove image distortions from mass spectrometry imaging data sets. Analytical Chemistry, 85(21):10249-10254.

Abstract

Time-of-flight secondary ion mass spectrometry imaging is a rapidly evolving technology. Its main application is the study of the distribution of small molecules on biological tissues. The sequential image acquisition process remains susceptible to measurement distortions that can render imaging data less analytically useful. Most of these artifacts show a repetitive nature from tile to tile. Here we statistically describe these distortions and derive two different algorithms to correct them. Both a generalized linear model approach and the linear discriminant analysis approach are able to increase image quality for negative and positive ion mode data sets. Additionally, performing simulation studies with repetitive and nonrepetitive tiling error we show that both algorithms are only removing repetitive distortions. It is further shown that the spectral component of the data set is not altered by the use of these correction methods. Both algorithms presented in this work greatly increase the image quality and improve the analytical usefulness of distorted images dramatically.

Abstract

Time-of-flight secondary ion mass spectrometry imaging is a rapidly evolving technology. Its main application is the study of the distribution of small molecules on biological tissues. The sequential image acquisition process remains susceptible to measurement distortions that can render imaging data less analytically useful. Most of these artifacts show a repetitive nature from tile to tile. Here we statistically describe these distortions and derive two different algorithms to correct them. Both a generalized linear model approach and the linear discriminant analysis approach are able to increase image quality for negative and positive ion mode data sets. Additionally, performing simulation studies with repetitive and nonrepetitive tiling error we show that both algorithms are only removing repetitive distortions. It is further shown that the spectral component of the data set is not altered by the use of these correction methods. Both algorithms presented in this work greatly increase the image quality and improve the analytical usefulness of distorted images dramatically.

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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Institute of Mathematics
Dewey Decimal Classification:510 Mathematics
Language:English
Date:November 2013
Deposited On:22 Jan 2014 13:04
Last Modified:05 Apr 2016 17:22
Publisher:American Chemical Society
ISSN:0003-2700
Publisher DOI:https://doi.org/10.1021/ac402018e
Related URLs:http://www.scopus.com/redirect/linking.url?targetURL=http%3a%2f%2fdx.doi.org%2f10.1021%2fac402018e&locationID=1&categoryID=4&eid=2-s2.0-84887709386&issn=00032700&linkType=ViewAtPublisher&year=2013&origin=recordpage&dig=b3f0b00217358a161e7d28c1a6bcce0b (Publisher)

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