Publication:

Low cost photoelectron yield setup for surface process monitoring

Date

Date

Date
2014
Journal Article
Published version

Citations

Citation copied

Hemmi, A., Cun, H., Roth, S., Osterwalder, J., & Greber, T. (2014). Low cost photoelectron yield setup for surface process monitoring. Journal of Vacuum Science & Technology A, 32(2), 023202. https://doi.org/10.1116/1.4866095

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10 since deposited on 2015-02-13
1last week
Acq. date: 2025-11-14

Views

1 since deposited on 2015-02-13
Acq. date: 2025-11-14

Additional indexing

Creators (Authors)

  • Hemmi, Adrian
    affiliation.icon.alt
  • Cun, Huanyao
    affiliation.icon.alt
  • Roth, Silvan
    affiliation.icon.alt
  • Osterwalder, Jürg
    affiliation.icon.alt
  • Greber, Thomas
    affiliation.icon.alt

Journal/Series Title

Journal/Series Title

Journal/Series Title

Volume

Volume

Volume
32

Number

Number

Number
2

Page range/Item number

Page range/Item number

Page range/Item number
023202

Item Type

Item Type

Item Type
Journal Article

Dewey Decimal Classifikation

Dewey Decimal Classifikation

Dewey Decimal Classifikation

Language

Language

Language
English

Publication date

Publication date

Publication date
2014

Date available

Date available

Date available
2015-02-13

Publisher

Publisher

Publisher

ISSN or e-ISSN

ISSN or e-ISSN

ISSN or e-ISSN
0734-2101

OA Status

OA Status

OA Status
Green

Free Access at

Free Access at

Free Access at
DOI

Metrics

Downloads

10 since deposited on 2015-02-13
1last week
Acq. date: 2025-11-14

Views

1 since deposited on 2015-02-13
Acq. date: 2025-11-14

Citations

Citation copied

Hemmi, A., Cun, H., Roth, S., Osterwalder, J., & Greber, T. (2014). Low cost photoelectron yield setup for surface process monitoring. Journal of Vacuum Science & Technology A, 32(2), 023202. https://doi.org/10.1116/1.4866095

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Files
Files available to download:2

Files

Files

Files
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