Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer

Abstract

An efficient and fast way to measure photoelectron diffraction data over the full 2π angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(1 1 1) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped Show more