Publication: Stimulated scintillation emission depletion X-ray imaging
Stimulated scintillation emission depletion X-ray imaging
Date
Date
Date
Citations
Alekhin, M. S., Patton, G., Dujardin, C., Douissard, P. A., Lebugle, M., Novotny, L., & Stampanoni, M. (2017). Stimulated scintillation emission depletion X-ray imaging. Optics Express, 25(2), 654. https://doi.org/10.1364/oe.25.000654
Abstract
Abstract
Abstract
X-ray microtomography is a widely applied tool for noninvasive structure investigations. The related detectors are usually based on a scintillator screen for the fast in situ conversion of an X-ray image into an optical image. Spatial resolution of the latter is fundamentally diffraction limited. In this work, we introduce stimulated scintillation emission depletion (SSED) X-ray imaging where, similar to stimulated emission depletion (STED) microscopy, a depletion beam is applied to the scintillator screen to overcome the diffraction
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Creators (Authors)
- Alekhin, Mikhail S
- Patton, Gaƫl
- Dujardin, Christophe
- Douissard, Paul A
- Lebugle, Maxime
- Novotny, Lukas
- Stampanoni, Marco
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Citations
Alekhin, M. S., Patton, G., Dujardin, C., Douissard, P. A., Lebugle, M., Novotny, L., & Stampanoni, M. (2017). Stimulated scintillation emission depletion X-ray imaging. Optics Express, 25(2), 654. https://doi.org/10.1364/oe.25.000654
