Publication:

On the Use of Random Forest for Two-Sample Testing

Date

Date

Date
2019
Working Paper

Citations

Citation copied

Hediger, S., Michel, L., & Näf, J. (2019). On the Use of Random Forest for Two-Sample Testing (No. 190306287; ArXiv.Org). https://doi.org/10.48550/arXiv.1903.06287

Abstract

Abstract

Abstract

We follow the line of using classifiers for two-sample testing and propose several tests based on the Random Forest classifier. The developed tests are easy to use, require no tuning and are applicable for any distribution on Rp, even in high-dimensions. We provide a comprehensive treatment for the use of classification for two-sample testing, derive the distribution of our tests under the Null and provide a power analysis, both in theory and with simulations. To simplify the use of the method, we also provide the R-package "hypoRF".

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Creators (Authors)

  • Hediger, Simon
  • Michel, Loris
  • Näf, Jeffrey

Series Name

Series Name

Series Name
ArXiv.org

Institution

Institution

Institution

Item Type

Item Type

Item Type
Working Paper

Dewey Decimal Classifikation

Dewey Decimal Classifikation

Dewey Decimal Classifikation

Scope

Scope

Scope
Discipline-based scholarship (basic research)

Language

Language

Language
English

Publication date

Publication date

Publication date
2019

Date available

Date available

Date available
2021-11-03

ISSN or e-ISSN

ISSN or e-ISSN

ISSN or e-ISSN
2331-8422

OA Status

OA Status

OA Status
Green

Free Access at

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Free Access at
DOI

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Other Identification Number

Other Identification Number
merlin-id:17699

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Citation copied

Hediger, S., Michel, L., & Näf, J. (2019). On the Use of Random Forest for Two-Sample Testing (No. 190306287; ArXiv.Org). https://doi.org/10.48550/arXiv.1903.06287

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