Publication: Low-energy calibration of XENON1T with an internal ${}^{37}$Ar source
Low-energy calibration of XENON1T with an internal ${}^{37}$Ar source
Date
Date
Date
Citations
Aprile, E., Abe, K., Agostini, F., Ahmed Maouloud, S., Alfonsi, M., Althueser, L., Andrieu, B., Angelino, E., Angevaare, J. R., Antochi, V. C., Antón Martin, D., Arneodo, F., Baudis, L., Baxter, A. L., Bellagamba, L., Biondi, R., Bismark, A., Brown, A., Peres, R., … et al. (2023). Low-energy calibration of XENON1T with an internal ${}^{37}$Ar source. European Physical Journal C : Particles and Fields, 83(6), 542. https://doi.org/10.1140/epjc/s10052-023-11512-z
Abstract
Abstract
Abstract
A low-energy electronic recoil calibration of XENON1T, a dual-phase xenon time projection chamber, with an internal $^{37}$Ar source was performed. This calibration source features a 35-day half-life and provides two mono-energetic lines at 2.82 keV and 0.27 keV. The photon yield and electron yield at 2.82 keV are measured to be ($32.3,\pm ,0.3$) photons/keV and ($$40.6,\pm ,0.5$$
Metrics
Downloads
Views
Additional indexing
Creators (Authors)
Journal/Series Title
Journal/Series Title
Journal/Series Title
Volume
Volume
Volume
Number
Number
Number
Page range/Item number
Page range/Item number
Page range/Item number
Item Type
Item Type
Item Type
In collections
Keywords
Language
Language
Language
Publication date
Publication date
Publication date
Date available
Date available
Date available
ISSN or e-ISSN
ISSN or e-ISSN
ISSN or e-ISSN
OA Status
OA Status
OA Status
Free Access at
Free Access at
Free Access at
Publisher DOI
Metrics
Downloads
Views
Citations
Aprile, E., Abe, K., Agostini, F., Ahmed Maouloud, S., Alfonsi, M., Althueser, L., Andrieu, B., Angelino, E., Angevaare, J. R., Antochi, V. C., Antón Martin, D., Arneodo, F., Baudis, L., Baxter, A. L., Bellagamba, L., Biondi, R., Bismark, A., Brown, A., Peres, R., … et al. (2023). Low-energy calibration of XENON1T with an internal ${}^{37}$Ar source. European Physical Journal C : Particles and Fields, 83(6), 542. https://doi.org/10.1140/epjc/s10052-023-11512-z