Publication: Thickness-Dependent Perovskite Octahedral Distortions at Heterointerfaces
Thickness-Dependent Perovskite Octahedral Distortions at Heterointerfaces
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Fowlie, J., Lichtensteiger, C., Gibert, M., Meley, H., Willmott, P., & Triscone, J.-M. (2019). Thickness-Dependent Perovskite Octahedral Distortions at Heterointerfaces. Nano Letters, 19(6), 4188–4194. https://doi.org/10.1021/acs.nanolett.9b01772
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In this study, we analyze how the octahedral tilts and rotations of thin films of LaNiO3 and LaAlO3 grown on different substrates, determined using synchrotron X-ray diffraction-measured half-integer Bragg peaks, depend upon the total film thickness. We find a striking difference between films grown on SrTiO3 and LaAlO3 substrates which appears to stem not only from the difference in epitaxial strain state but also from the level of continuity at the heterointerface. In particular, the chemically and structurally discontinuous LaNiO3/
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- Fowlie, Jennifer
- Lichtensteiger, Céline
- Meley, Hugo
- Willmott, Philip
- Triscone, Jean-Marc
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Fowlie, J., Lichtensteiger, C., Gibert, M., Meley, H., Willmott, P., & Triscone, J.-M. (2019). Thickness-Dependent Perovskite Octahedral Distortions at Heterointerfaces. Nano Letters, 19(6), 4188–4194. https://doi.org/10.1021/acs.nanolett.9b01772
