Publication: Simultaneous refractive index and thickness measurement with the transmission interferometric adsorption sensor
Simultaneous refractive index and thickness measurement with the transmission interferometric adsorption sensor
Date
Date
Date
2010
Journal Article
Published version
| cris.lastimport.scopus | 2025-07-13T03:43:18Z | |
| cris.lastimport.wos | 2025-08-05T01:34:36Z | |
| dc.contributor.institution | University of Zurich | |
| dc.date.accessioned | 2011-01-26T15:30:15Z | |
| dc.date.available | 2011-01-26T15:30:15Z | |
| dc.date.issued | 2010 | |
| dc.identifier.doi | 10.1088/0022-3727/43/40/405302 | |
| dc.identifier.issn | 0022-3727 | |
| dc.identifier.scopus | 2-s2.0-78249275191 | |
| dc.identifier.uri | https://www.zora.uzh.ch/handle/20.500.14742/57985 | |
| dc.identifier.wos | 000282059700010 | |
| dc.language.iso | eng | |
| dc.subject.ddc | 170 Ethics | |
| dc.subject.ddc | 610 Medicine & health | |
| dc.title | Simultaneous refractive index and thickness measurement with the transmission interferometric adsorption sensor | |
| dc.type | article | |
| dcterms.accessRights | info:eu-repo/semantics/closedAccess | |
| dcterms.bibliographicCitation.journaltitle | Journal of Physics D: Applied Physics | |
| dcterms.bibliographicCitation.number | 40 | |
| dcterms.bibliographicCitation.originalpublishername | Institute of Physics Publishing | |
| dcterms.bibliographicCitation.pagestart | 405302 | |
| dcterms.bibliographicCitation.volume | 43 | |
| dspace.entity.type | Publication | en |
| uzh.contributor.affiliation | ETH Zürich | |
| uzh.contributor.affiliation | ETH Zürich | |
| uzh.contributor.affiliation | ETH Zürich, Empa - Swiss Federal Laboratories for Materials Science and Technology | |
| uzh.contributor.affiliation | ETH Zürich | |
| uzh.contributor.author | Sannomiya, T | |
| uzh.contributor.author | Balmer, T E | |
| uzh.contributor.author | Heuberger, M | |
| uzh.contributor.author | Vörös, J | |
| uzh.contributor.correspondence | Yes | |
| uzh.contributor.correspondence | No | |
| uzh.contributor.correspondence | No | |
| uzh.contributor.correspondence | No | |
| uzh.document.availability | content_undefined | |
| uzh.eprint.datestamp | 2011-01-26 15:30:15 | |
| uzh.eprint.lastmod | 2025-08-05 01:48:33 | |
| uzh.eprint.statusChange | 2011-01-26 15:30:15 | |
| uzh.harvester.eth | Yes | |
| uzh.harvester.nb | No | |
| uzh.identifier.doi | 10.5167/uzh-43524 | |
| uzh.jdb.eprintsId | 20202 | |
| uzh.oastatus.unpaywall | closed | |
| uzh.oastatus.zora | Closed | |
| uzh.publication.citation | Sannomiya, T., Balmer, T. E., Heuberger, M., & Vörös, J. (2010). Simultaneous refractive index and thickness measurement with the transmission interferometric adsorption sensor. Journal of Physics D: Applied Physics, 43, 405302. https://doi.org/10.1088/0022-3727/43/40/405302 | |
| uzh.publication.freeAccessAt | doi | |
| uzh.publication.originalwork | original | |
| uzh.publication.publishedStatus | final | |
| uzh.scopus.impact | 17 | |
| uzh.scopus.subjects | Electronic, Optical and Magnetic Materials | |
| uzh.scopus.subjects | Condensed Matter Physics | |
| uzh.scopus.subjects | Acoustics and Ultrasonics | |
| uzh.scopus.subjects | Surfaces, Coatings and Films | |
| uzh.workflow.doaj | uzh.workflow.doaj.false | |
| uzh.workflow.eprintid | 43524 | |
| uzh.workflow.fulltextStatus | restricted | |
| uzh.workflow.revisions | 146 | |
| uzh.workflow.rightsCheck | keininfo | |
| uzh.workflow.status | archive | |
| uzh.wos.impact | 17 | |
| Files | Original bundle
0022-3727_43_40_405302.pdfview file |Download1.08 MB | |
| Publication available in collections: |
