Publication:

Current-induced critical state in NbN thin-film structures

Date

Date

Date
2008
Journal Article
Published version

Citations

Citation copied

Il’in, K., Siegel, M., Engel, A., Bartolf, H., Schilling, A., Semenov, A., & Hübers, H. W. (2008). Current-induced critical state in NbN thin-film structures. Journal of Low Temperature Physics, 151, 585–590. https://doi.org/10.1007/s10909-007-9690-5

Abstract

Abstract

Abstract

The temperature dependence of the critical current of NbN thin-film bridges was experimentally studied. At low temperatures we observed significant enhancement (up to two times at 4 K) of the critical current density over de-pinning value in the sub-micrometer wide bridges. This enhancement can be described by an increase of the edge barrier for penetration of magnetic vortices into narrow superconducting strips.

Additional indexing

Creators (Authors)

  • Il'in, K
    affiliation.icon.alt
  • Siegel, M
    affiliation.icon.alt
  • Engel, A
    affiliation.icon.alt
  • Bartolf, H
    affiliation.icon.alt
  • Schilling, A
    affiliation.icon.alt
  • Semenov, A
    affiliation.icon.alt
  • Hübers, H W
    affiliation.icon.alt

Journal/Series Title

Journal/Series Title

Journal/Series Title

Volume

Volume

Volume
151

Number

Number

Number
1-2

Page range/Item number

Page range/Item number

Page range/Item number
585

Page end

Page end

Page end
590

Item Type

Item Type

Item Type
Journal Article

Dewey Decimal Classifikation

Dewey Decimal Classifikation

Dewey Decimal Classifikation

Language

Language

Language
English

Publication date

Publication date

Publication date
2008

Date available

Date available

Date available
2009-02-04

Publisher

Publisher

Publisher

ISSN or e-ISSN

ISSN or e-ISSN

ISSN or e-ISSN
0022-2291

Additional Information

Additional Information

Additional Information
The original publication is available at www.springerlink.com

OA Status

OA Status

OA Status
Green

Citations

Citation copied

Il’in, K., Siegel, M., Engel, A., Bartolf, H., Schilling, A., Semenov, A., & Hübers, H. W. (2008). Current-induced critical state in NbN thin-film structures. Journal of Low Temperature Physics, 151, 585–590. https://doi.org/10.1007/s10909-007-9690-5

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