Publication: Fine-grained just-in-time defect prediction
Fine-grained just-in-time defect prediction
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Pascarella, L., Palomba, F., & Bacchelli, A. (2019). Fine-grained just-in-time defect prediction. Journal of Systems and Software, 150, 22–36. https://doi.org/10.1016/j.jss.2018.12.001
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Abstract
Defect prediction models focus on identifying defect-prone code elements, for example to allow practitioners to allocate testing resources on specific subsystems and to provide assistance during code reviews. While the research community has been highly active in proposing metrics and methods to predict defects on long-term periods (i.e.,at release time), a recent trend is represented by the so-called short-term defect prediction (i.e.,at commit-level). Indeed, this strategy represents an effective alternative in terms of effort requi
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Pascarella, L., Palomba, F., & Bacchelli, A. (2019). Fine-grained just-in-time defect prediction. Journal of Systems and Software, 150, 22–36. https://doi.org/10.1016/j.jss.2018.12.001