Publication:

Fine-grained just-in-time defect prediction

Date

Date

Date
2019
Journal Article
Published version

Citations

Citation copied

Pascarella, L., Palomba, F., & Bacchelli, A. (2019). Fine-grained just-in-time defect prediction. Journal of Systems and Software, 150, 22–36. https://doi.org/10.1016/j.jss.2018.12.001

Abstract

Abstract

Abstract

Defect prediction models focus on identifying defect-prone code elements, for example to allow practitioners to allocate testing resources on specific subsystems and to provide assistance during code reviews. While the research community has been highly active in proposing metrics and methods to predict defects on long-term periods (i.e.,at release time), a recent trend is represented by the so-called short-term defect prediction (i.e.,at commit-level). Indeed, this strategy represents an effective alternative in terms of effort requi

Metrics

Downloads

267 since deposited on 2021-01-27
Acq. date: 2025-11-13

Views

144 since deposited on 2021-01-27
Acq. date: 2025-11-13

Additional indexing

Creators (Authors)

  • Pascarella, Luca
    affiliation.icon.alt
  • Palomba, Fabio
    affiliation.icon.alt
  • Bacchelli, Alberto
    affiliation.icon.alt

Journal/Series Title

Journal/Series Title

Journal/Series Title

Volume

Volume

Volume
150

Page range/Item number

Page range/Item number

Page range/Item number
22

Page end

Page end

Page end
36

Item Type

Item Type

Item Type
Journal Article

Dewey Decimal Classifikation

Dewey Decimal Classifikation

Dewey Decimal Classifikation

Scope

Scope

Scope
Discipline-based scholarship (basic research)

Language

Language

Language
English

Publication date

Publication date

Publication date
2019

Date available

Date available

Date available
2021-01-27

Publisher

Publisher

Publisher

ISSN or e-ISSN

ISSN or e-ISSN

ISSN or e-ISSN
0164-1212

OA Status

OA Status

OA Status
Green

Other Identification Number

Other Identification Number

Other Identification Number
merlin-id:20245

Metrics

Downloads

267 since deposited on 2021-01-27
Acq. date: 2025-11-13

Views

144 since deposited on 2021-01-27
Acq. date: 2025-11-13

Citations

Citation copied

Pascarella, L., Palomba, F., & Bacchelli, A. (2019). Fine-grained just-in-time defect prediction. Journal of Systems and Software, 150, 22–36. https://doi.org/10.1016/j.jss.2018.12.001

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Files

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Files
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