Publication:

Advantages of phase retrieval for fast x-ray tomographic microscopy

Date

Date

Date
2013
Journal Article
Published version
Simple data Full metadata Statistics
cris.lastimport.scopus2025-07-30T03:36:05Z
cris.lastimport.wos2025-08-10T01:50:35Z
dc.contributor.institutionUniversity of Zurich
dc.date.accessioned2014-02-21T10:59:43Z
dc.date.available2014-02-21T10:59:43Z
dc.date.issued2013
dc.identifier.doi10.1088/0022-3727/46/49/494004
dc.identifier.issn0022-3727
dc.identifier.scopus2-s2.0-84889590963
dc.identifier.urihttps://www.zora.uzh.ch/handle/20.500.14742/102239
dc.identifier.wos000327887500005
dc.language.isoeng
dc.subject.ddc170 Ethics
dc.subject.ddc610 Medicine & health
dc.title

Advantages of phase retrieval for fast x-ray tomographic microscopy

dc.typearticle
dcterms.accessRightsinfo:eu-repo/semantics/restrictedAccess
dcterms.bibliographicCitation.journaltitleJournal of Physics D: Applied Physics
dcterms.bibliographicCitation.number49
dcterms.bibliographicCitation.originalpublishernameIOP Publishing
dcterms.bibliographicCitation.pagestart494004
dcterms.bibliographicCitation.volume46
dspace.entity.typePublicationen
uzh.contributor.affiliationPaul Scherrer Institut
uzh.contributor.affiliationPaul Scherrer Institut
uzh.contributor.affiliationPaul Scherrer Institut, Université de Lausanne (UNIL)
uzh.contributor.affiliationPaul Scherrer Institut, Ceské vysoké ucení technické v Praze
uzh.contributor.affiliationImperial College London, University of Oxford
uzh.contributor.affiliationPaul Scherrer Institut
uzh.contributor.affiliationUniversity of Oxford
uzh.contributor.affiliationImperial College London
uzh.contributor.affiliationCeské vysoké ucení technické v Praze
uzh.contributor.affiliationPaul Scherrer Institut, University of Zurich
uzh.contributor.authorMokso, R
uzh.contributor.authorMarone, F
uzh.contributor.authorIrvine, S
uzh.contributor.authorNyvlt, M
uzh.contributor.authorSchwyn, D
uzh.contributor.authorMader, K
uzh.contributor.authorTaylor, G K
uzh.contributor.authorKrapp, H G
uzh.contributor.authorSkeren, M
uzh.contributor.authorStampanoni, M
uzh.contributor.correspondenceYes
uzh.contributor.correspondenceNo
uzh.contributor.correspondenceNo
uzh.contributor.correspondenceNo
uzh.contributor.correspondenceNo
uzh.contributor.correspondenceNo
uzh.contributor.correspondenceNo
uzh.contributor.correspondenceNo
uzh.contributor.correspondenceNo
uzh.contributor.correspondenceNo
uzh.document.availabilitynone
uzh.eprint.datestamp2014-02-21 10:59:43
uzh.eprint.lastmod2025-08-10 01:56:31
uzh.eprint.statusChange2014-02-21 10:59:43
uzh.harvester.ethYes
uzh.harvester.nbNo
uzh.identifier.doi10.5167/uzh-92499
uzh.jdb.eprintsId20202
uzh.oastatus.unpaywallclosed
uzh.oastatus.zoraClosed
uzh.publication.citationMokso, R; Marone, F; Irvine, S; Nyvlt, M; Schwyn, D; Mader, K; Taylor, G K; Krapp, H G; Skeren, M; Stampanoni, M (2013). Advantages of phase retrieval for fast x-ray tomographic microscopy. Journal of Physics D: Applied Physics, 46(49):494004.
uzh.publication.originalworkoriginal
uzh.publication.publishedStatusfinal
uzh.scopus.impact47
uzh.scopus.subjectsElectronic, Optical and Magnetic Materials
uzh.scopus.subjectsCondensed Matter Physics
uzh.scopus.subjectsAcoustics and Ultrasonics
uzh.scopus.subjectsSurfaces, Coatings and Films
uzh.workflow.doajuzh.workflow.doaj.false
uzh.workflow.eprintid92499
uzh.workflow.fulltextStatusrestricted
uzh.workflow.revisions56
uzh.workflow.rightsCheckkeininfo
uzh.workflow.statusarchive
uzh.wos.impact43
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