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Independent laboratory characterization of NEO HySpex imaging spectrometers VNIR-1600 and SWIR-320m-e

Lenhard, Karim; Baumgartner, Andreas; Schwarzmaier, Thomas (2015). Independent laboratory characterization of NEO HySpex imaging spectrometers VNIR-1600 and SWIR-320m-e. IEEE Transactions on Geoscience and Remote Sensing, 53(4):1828-1841.

Abstract

The Remote Sensing Technology Institute (Institut für Methodik der Fernerkundung) of the German Aerospace Agency (DLR) operates two sensors for airborne hyperspectral imaging, i.e., a Norsk Elektro Optikk A/S (NEO) HySpex VNIR-1600 and a NEO HySpex SWIR-320m-e. Since these sensors are used for the development of physically based inversion algorithms, atmospheric correction algorithms and for calibration/validation activities, their properties need to be characterized in detail, and an accurate calibration is mandatory. The characterization is performed at the calibration laboratory of DLR for imaging spectrometers in Oberpfaffenhofen. Key results of the characterization are assessments of the radiometric, spectral, and geometric performances, including the typical optical distortions prevalent in pushbroom imaging spectrometers, keystone and smile, and the associated measurement uncertainties. Potential sources of systematic error, the detector nonlinearity and the polarization sensitivity are discussed. The radiometric calibration is traceably performed to the German national metrology institute Physikalisch-Technische Bundesanstalt, whereas the spectral measurements can be traced back to the spectral properties of atomic line lamps. The implemented level 0 to level 1 calibration procedure is presented as well.

Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Institute of Geography
Dewey Decimal Classification:910 Geography & travel
Scopus Subject Areas:Physical Sciences > Electrical and Electronic Engineering
Physical Sciences > General Earth and Planetary Sciences
Language:English
Date:2015
Deposited On:12 Nov 2014 14:33
Last Modified:04 Nov 2024 04:30
Publisher:Institute of Electrical and Electronics Engineers
ISSN:0196-2892
Additional Information:© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
OA Status:Hybrid
Publisher DOI:https://doi.org/10.1109/tgrs.2014.2349737
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