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Current-induced critical state in NbN thin-film structures


Il'in, K; Siegel, M; Engel, A; Bartolf, H; Schilling, A; Semenov, A; Hübers, H W (2008). Current-induced critical state in NbN thin-film structures. Journal of Low Temperature Physics, 151(1-2):585-590.

Abstract

The temperature dependence of the critical current of NbN thin-film bridges was experimentally studied. At low temperatures we observed significant enhancement (up to two times at 4 K) of the critical current density over de-pinning value in the sub-micrometer wide bridges. This enhancement can be described by an increase of the edge barrier for penetration of magnetic vortices into narrow superconducting strips.

Abstract

The temperature dependence of the critical current of NbN thin-film bridges was experimentally studied. At low temperatures we observed significant enhancement (up to two times at 4 K) of the critical current density over de-pinning value in the sub-micrometer wide bridges. This enhancement can be described by an increase of the edge barrier for penetration of magnetic vortices into narrow superconducting strips.

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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Scopus Subject Areas:Physical Sciences > Atomic and Molecular Physics, and Optics
Physical Sciences > General Materials Science
Physical Sciences > Condensed Matter Physics
Language:English
Date:2008
Deposited On:04 Feb 2009 14:02
Last Modified:29 Jul 2020 17:28
Publisher:Springer
ISSN:0022-2291
Additional Information:The original publication is available at www.springerlink.com
OA Status:Green
Publisher DOI:https://doi.org/10.1007/s10909-007-9690-5

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