An efficient and fast way to measure photoelectron diffraction data over the full 2π angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(1 1 1) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped with a channeltron detector. As a result, the data acquisition time can be reduced by roughly a factor of ten while obtaining comparable if not superior data quality. The sampling technique is extended to UV-excited angle-resolved photoelectron spectroscopy as illustrated by a mapping of the Fermi surface of Cu(1 1 1).