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Temperature and parasitic photocurrent effects in dynamic vision sensors


Nozaki, Yuji; Delbruck, Tobi (2017). Temperature and parasitic photocurrent effects in dynamic vision sensors. IEEE Transactions on Electron Devices, 64(8):3239-3245.

Abstract

The effect of temperature and parasitic photocurrent on event-based dynamic vision sensors (DVS) is important because of their application in uncontrolled robotic, automotive, and surveillance applications. This paper considers the temperature dependence of DVS threshold temporal contrast (TC), dark current, and background activity caused by junction leakage. New theory shows that if bias currents have a constant ratio, then ideally the DVS threshold TC is temperature independent, but the presence of temperature dependent junction leakage currents causes nonideal behavior at elevated temperature. Both measured photodiode dark current and leakage induced event activity follow Arhenius activation. This paper also defines a new metric for parasitic photocurrent quantum efficiency and measures the sensitivity of DVS pixels to parasitic photocurrent.

Abstract

The effect of temperature and parasitic photocurrent on event-based dynamic vision sensors (DVS) is important because of their application in uncontrolled robotic, automotive, and surveillance applications. This paper considers the temperature dependence of DVS threshold temporal contrast (TC), dark current, and background activity caused by junction leakage. New theory shows that if bias currents have a constant ratio, then ideally the DVS threshold TC is temperature independent, but the presence of temperature dependent junction leakage currents causes nonideal behavior at elevated temperature. Both measured photodiode dark current and leakage induced event activity follow Arhenius activation. This paper also defines a new metric for parasitic photocurrent quantum efficiency and measures the sensitivity of DVS pixels to parasitic photocurrent.

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Additional indexing

Item Type:Journal Article, original work
Communities & Collections:07 Faculty of Science > Institute of Neuroinformatics
Dewey Decimal Classification:570 Life sciences; biology
Scopus Subject Areas:Physical Sciences > Electronic, Optical and Magnetic Materials
Physical Sciences > Electrical and Electronic Engineering
Language:English
Date:2017
Deposited On:27 Feb 2018 16:24
Last Modified:08 Apr 2020 23:20
Publisher:IEEE Transactions on Electron Devices
Series Name:IEEE Transactions on Electron Devices
Number of Pages:7
OA Status:Green
Publisher DOI:https://doi.org/10.1109/TED.2017.2717848

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