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Pulsed laser deposition of atomically flat La1-xSrxMnO3 thin films using a novel target geometry


Willmott, P R; Herger, R; Falub, M C; Patthey, L; Döbeli, M; Falub, C V; Shi, M; Schneider, M (2004). Pulsed laser deposition of atomically flat La1-xSrxMnO3 thin films using a novel target geometry. Applied Physics A, 79(4-6):1199-1201.

Abstract

A new ablation target geometry is presented that was used to produce thin films of La1-xSrxMnO3 grown heteroepitaxially on SrTiO3 by pulsed reactive crossed-beam laser ablation. The films were grown in order to perform angle-resolved photoelectron spectroscopy, which demands that the surface be atomically flat. In situ and ex situ analysis shows that this condition was met, even after depositing to a thickness of over 100nm

Abstract

A new ablation target geometry is presented that was used to produce thin films of La1-xSrxMnO3 grown heteroepitaxially on SrTiO3 by pulsed reactive crossed-beam laser ablation. The films were grown in order to perform angle-resolved photoelectron spectroscopy, which demands that the surface be atomically flat. In situ and ex situ analysis shows that this condition was met, even after depositing to a thickness of over 100nm

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Item Type:Journal Article, refereed, original work
Communities & Collections:National licences > 142-005
Dewey Decimal Classification:170 Ethics
610 Medicine & health
Language:English
Date:1 September 2004
Deposited On:19 Oct 2018 12:29
Last Modified:24 Nov 2018 03:09
Publisher:Springer
ISSN:0947-8396
OA Status:Green
Publisher DOI:https://doi.org/10.1007/s00339-004-2717-8
Related URLs:https://www.swissbib.ch/Search/Results?lookfor=nationallicencespringer101007s0033900427178 (Library Catalogue)

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