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Signal coupling to embedded pitch adapters in silicon sensors


Artuso, M; Betancourt, C; Bezshyiko, I; Blusk, S; Bruendler, R; Bugiel, S; Dasgupta, R; Dendek, A; Dey, B; Ely, S; Lionetto, F; Petruzzo, M; Polyakov, I; Rudolph, M; Schindler, H; Steinkamp, O; Stone, S (2018). Signal coupling to embedded pitch adapters in silicon sensors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 877:252-258.

Abstract

We have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed signal formation on the nearby strips and a pick-up effect on the pitch adapter. This can result in an inefficiency to detect particles passing through the pitch adapter region. All these effects have been observed in the beam test data.

Abstract

We have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed signal formation on the nearby strips and a pick-up effect on the pitch adapter. This can result in an inefficiency to detect particles passing through the pitch adapter region. All these effects have been observed in the beam test data.

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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Uncontrolled Keywords:Nuclear and High Energy Physics, Instrumentation
Language:English
Date:1 January 2018
Deposited On:30 Nov 2018 15:49
Last Modified:24 Sep 2019 23:54
Publisher:Elsevier
ISSN:0168-9002
OA Status:Green
Free access at:Publisher DOI. An embargo period may apply.
Publisher DOI:https://doi.org/10.1016/j.nima.2017.09.039

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