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BiasBed - Rigorous Texture Bias Evaluation

Kalischek, Nikolai; Daudt, Rodrigo Caye; Peters, Torben; Furrer, Reinhard; Wegner, Jan Dirk; Schindler, Konrad (2023). BiasBed - Rigorous Texture Bias Evaluation. In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Vancouver, BC, Canada, 17 June 2023 - 24 June 2023. Institute of Electrical and Electronics Engineers, 22221-22230.

Abstract

The well-documented presence of texture bias in modern convolutional neural networks has led to a plethora of algorithms that promote an emphasis on shape cues, often to support generalization to new domains. Yet, common datasets, benchmarks and general model selection strategies are missing, and there is no agreed, rigorous evaluation protocol. In this paper, we investigate difficulties and limitations when training networks with reduced texture bias. In particular, we also show that proper evaluation and meaningful comparisons between methods are not trivial. We introduce BiasBed, a testbed for texture- and style-biased training, including multiple datasets and a range of existing algorithms. It comes with an extensive evaluation protocol that includes rigorous hypothesis testing to gauge the significance of the results, despite the considerable training instability of some style bias methods. Our extensive experiments, shed new light on the need for careful, statistically founded evaluation protocols for style bias (and beyond). E.g., we find that some algorithms proposed in the literature do not significantly mitigate the impact of style bias at all. With the release of BiasBed, we hope to foster a common understanding of consistent and meaningful comparisons, and consequently faster progress towards learning methods free of texture bias. Code is available at https://github.com/D1noFuzi/BiasBed

Additional indexing

Item Type:Conference or Workshop Item (Paper), refereed, original work
Communities & Collections:07 Faculty of Science > Institute of Mathematics
07 Faculty of Science > Institute for Computational Science
08 Research Priority Programs > Digital Society Initiative
Dewey Decimal Classification:510 Mathematics
Scopus Subject Areas:Physical Sciences > Software
Physical Sciences > Computer Vision and Pattern Recognition
Language:English
Event End Date:24 June 2023
Deposited On:09 Jan 2024 10:34
Last Modified:06 Jun 2024 03:21
Publisher:Institute of Electrical and Electronics Engineers
Series Name:IEEE Conference on Computer Vision and Pattern Recognition. Proceedings
Number:2023.02128
ISSN:1063-6919
ISBN:9798350301298
Additional Information:https://ieeexplore.ieee.org/document/10203220
OA Status:Closed
Publisher DOI:https://doi.org/10.1109/cvpr52729.2023.02128
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