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Systematic structure investigation of YBCO thin films with direct methods and surface X-ray diffraction


Schlepütz, Christian M. Systematic structure investigation of YBCO thin films with direct methods and surface X-ray diffraction. 2009, University of Zurich, Faculty of Science.

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Item Type:Dissertation (monographical)
Referees:Osterwalder Jürg, Willmott Philip R
Communities & Collections:UZH Dissertations
Dewey Decimal Classification:530 Physics
Language:English
Place of Publication:Zürich
Date:2009
Deposited On:05 Mar 2010 18:54
Last Modified:24 Sep 2019 16:48
Number of Pages:259
OA Status:Green
Related URLs:https://www.recherche-portal.ch/primo-explore/fulldisplay?docid=ebi01_prod005825868&context=L&vid=ZAD&search_scope=default_scope&tab=default_tab&lang=de_DE (Library Catalogue)

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