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Systematic structure investigation of YBCO thin films with direct methods and surface X-ray diffraction


Schlepütz, Christian M. Systematic structure investigation of YBCO thin films with direct methods and surface X-ray diffraction. 2009, University of Zurich, Faculty of Science.

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Item Type:Dissertation (monographical)
Referees:Osterwalder Jürg, Willmott Philip R, Keller Hugo, Mesot J, Patterson Bruce
Communities & Collections:07 Faculty of Science > Physics Institute
UZH Dissertations
Dewey Decimal Classification:530 Physics
Language:English
Place of Publication:Zürich
Date:2009
Deposited On:05 Mar 2010 18:54
Last Modified:16 Sep 2020 15:17
Number of Pages:259
OA Status:Green
Related URLs:https://www.recherche-portal.ch/permalink/f/5u2s2l/ebi01_prod005825868 (Library Catalogue)
Other Identification Number:urn:nbn:ch:bel-330184

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