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Influence of thickness, width and temperature on critical current density of Nb thin film structures

Il'in, K; Rall, D; Siegel, M; Engel, A; Schilling, A; Semenov, A; Huebers, H W (2010). Influence of thickness, width and temperature on critical current density of Nb thin film structures. Physica C: Superconductivity, 470(19):953-956.

Abstract

The density of critical currents jC in Nb thin films with thickness smaller than 15 nm and width between 100 nm and 10 μm has been measured in a wide temperature range. We have found that the temperature dependencies of jC in sub-micrometer wide bridges at 0.7TC < T < TC are well described by the Ginzburg–Landau de-pairing critical current. In wider bridges already at T < 0.9TC the jC value is significantly reduced due to the penetration and de-pinning of magnetic vortices.

Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Scopus Subject Areas:Physical Sciences > Electronic, Optical and Magnetic Materials
Physical Sciences > Condensed Matter Physics
Physical Sciences > Energy Engineering and Power Technology
Physical Sciences > Electrical and Electronic Engineering
Language:English
Date:2010
Deposited On:13 Feb 2011 18:55
Last Modified:14 Oct 2024 03:33
Publisher:Elsevier
ISSN:0921-4534
OA Status:Closed
Publisher DOI:https://doi.org/10.1016/j.physc.2010.02.042

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