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Il'in, K; Rall, D; Siegel, M; Engel, A; Schilling, A; Semenov, A; Huebers, H W (2010). Influence of thickness, width and temperature on critical current density of Nb thin film structures. Physica C: Superconductivity, 470(19):953-956.
The density of critical currents jC in Nb thin films with thickness smaller than 15 nm and width between 100 nm and 10 μm has been measured in a wide temperature range. We have found that the temperature dependencies of jC in sub-micrometer wide bridges at 0.7TC < T < TC are well described by the Ginzburg–Landau de-pairing critical current. In wider bridges already at T < 0.9TC the jC value is significantly reduced due to the penetration and de-pinning of magnetic vortices.
| Item Type: | Journal Article, refereed, original work |
|---|---|
| Communities & Collections: | 07 Faculty of Science > Physics Institute |
| Dewey Decimal Classification: | 530 Physics |
| Scopus Subject Areas: | Physical Sciences > Electronic, Optical and Magnetic Materials
Physical Sciences > Condensed Matter Physics Physical Sciences > Energy Engineering and Power Technology Physical Sciences > Electrical and Electronic Engineering |
| Language: | English |
| Date: | 2010 |
| Deposited On: | 13 Feb 2011 18:55 |
| Last Modified: | 05 May 2025 01:36 |
| Publisher: | Elsevier |
| ISSN: | 0921-4534 |
| OA Status: | Closed |
| Publisher DOI: | https://doi.org/10.1016/j.physc.2010.02.042 |
Il'in, K