Sannomiya, T; Balmer, T E; Heuberger, M; Vörös, J (2010). Simultaneous refractive index and thickness measurement with the transmission interferometric adsorption sensor. Journal of Physics D: Applied Physics, 43(40):405302.
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Item Type: | Journal Article, refereed, original work |
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Communities & Collections: | 04 Faculty of Medicine > Institute of Biomedical Engineering |
Dewey Decimal Classification: | 170 Ethics
610 Medicine & health |
Scopus Subject Areas: | Physical Sciences > Electronic, Optical and Magnetic Materials
Physical Sciences > Condensed Matter Physics Physical Sciences > Acoustics and Ultrasonics Physical Sciences > Surfaces, Coatings and Films |
Language: | English |
Date: | 2010 |
Deposited On: | 26 Jan 2011 15:30 |
Last Modified: | 23 Jan 2022 18:08 |
Publisher: | Institute of Physics Publishing |
ISSN: | 0022-3727 |
OA Status: | Closed |
Free access at: | Publisher DOI. An embargo period may apply. |
Publisher DOI: | https://doi.org/10.1088/0022-3727/43/40/405302 |
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Permanent URL: https://doi.org/10.5167/uzh-43524
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ETH Zürich, Zurich ZH, Switzerland
ETH Zürich, Zurich ZH, Switzerland
ETH Zürich, Zurich ZH, Switzerland
Empa - Swiss Federal Laboratories for Materials Science and Technology, Dübendorf, Switzerland
Empa - Swiss Federal Laboratories for Materials Science and Technology, Dübendorf, Switzerland
ETH Zürich, Zurich ZH, Switzerland