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Tomographic Hard X-ray Phase Contrast Micro- and Nano-imaging at TOMCAT


Stampanoni, M; Marone, F; Modregger, P; Pinzer, B; Thüring, T; Vila-Comamala, J; David, C; Mokso, R (2010). Tomographic Hard X-ray Phase Contrast Micro- and Nano-imaging at TOMCAT. In: 6th international conference on medical applications of synchrotron radiation, Melbourne, Australia, 23 July 2010, 13-17.

Abstract

This article illustrates the phase contrast instrumentation installed at the Tomographic Microscopy and Coherent Radiology beamline (TOMCAT) of the Swiss Light Source. Our experimental framework has been designed to extract phase information at spatial resolutions covering three orders of magnitude. For moderate (5-10 microns) resolutions we implemented a two-gratings interferometer, operated at energies between 14 and 40 keV. For high resolution (1-5 microns) we obtain phase information thanks to a modified transport of intensity approach. For very high-resolutions (0.1-0.5 microns) we developed a broadband hard X-ray full-field microscope operated in Zernike-phase contrast.

Abstract

This article illustrates the phase contrast instrumentation installed at the Tomographic Microscopy and Coherent Radiology beamline (TOMCAT) of the Swiss Light Source. Our experimental framework has been designed to extract phase information at spatial resolutions covering three orders of magnitude. For moderate (5-10 microns) resolutions we implemented a two-gratings interferometer, operated at energies between 14 and 40 keV. For high resolution (1-5 microns) we obtain phase information thanks to a modified transport of intensity approach. For very high-resolutions (0.1-0.5 microns) we developed a broadband hard X-ray full-field microscope operated in Zernike-phase contrast.

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Additional indexing

Item Type:Conference or Workshop Item (Paper), refereed, original work
Communities & Collections:04 Faculty of Medicine > Institute of Biomedical Engineering
Dewey Decimal Classification:170 Ethics
610 Medicine & health
Scopus Subject Areas:Physical Sciences > General Physics and Astronomy
Language:English
Event End Date:23 July 2010
Deposited On:27 Jan 2011 16:36
Last Modified:23 Jan 2022 18:11
ISSN:0094-243X (P) 1551-7616 (E)
Additional Information:AIP Conference Proceedings
OA Status:Closed
Publisher DOI:https://doi.org/10.1063/1.3478189

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