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In situ X-ray diffraction study of the hydrothermal crystallization of hierarchical Bi2WO6 nanostructures


Zhou, Y; Antonova, E; Bensch, W; Patzke, Greta R (2010). In situ X-ray diffraction study of the hydrothermal crystallization of hierarchical Bi2WO6 nanostructures. Nanoscale, 2(11):2412-2417.

Abstract

The hydrothermal crystallization of hierarchical Bi2WO6 nanostructures has been monitored with in situ energy-dispersive X-ray diffraction (EDXRD). The kinetic data analysis according to the Avrami-Erofe'ev model suggests that the formation of nanostructured Bi2WO6 is diffusion controlled with Avrami exponents around 0.5 and that the growth mechanism is temperature independent in the interval from 150 to 180 degrees C. Furthermore, the reaction kinetics and the crystal structure of the resulting hydrothermal products depend on the pH value of the Bi(NO3)(3)center dot 5H(2)O/K2WO4 hydrothermal system.

Abstract

The hydrothermal crystallization of hierarchical Bi2WO6 nanostructures has been monitored with in situ energy-dispersive X-ray diffraction (EDXRD). The kinetic data analysis according to the Avrami-Erofe'ev model suggests that the formation of nanostructured Bi2WO6 is diffusion controlled with Avrami exponents around 0.5 and that the growth mechanism is temperature independent in the interval from 150 to 180 degrees C. Furthermore, the reaction kinetics and the crystal structure of the resulting hydrothermal products depend on the pH value of the Bi(NO3)(3)center dot 5H(2)O/K2WO4 hydrothermal system.

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Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Department of Chemistry
Dewey Decimal Classification:540 Chemistry
Scopus Subject Areas:Physical Sciences > General Materials Science
Language:English
Date:2010
Deposited On:25 Feb 2011 17:50
Last Modified:30 Jul 2020 01:00
Publisher:Royal Society of Chemistry
ISSN:2040-3364
OA Status:Closed
Publisher DOI:https://doi.org/10.1039/c0nr00340a
PubMed ID:20714655
Other Identification Number:ISI:000283938600015

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