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Confession Session: Learning from others mistakes


Abshire, P; Bermak, A; Berner, R; Cauwenberghs, G; Chen, S; Christen, J B; Constandinou, T; Culurciello, E; Dandin, M; Datta, T; Delbruck, T; Dudek, P; Eftekhar, A; Etienne-Cummings, R; Indiveri, G; Law, M K; Linares-Barranco, B; Tapson, J; Tang, W; Zhai, Y (2011). Confession Session: Learning from others mistakes. In: IEEE International Symposium on Circuits and Systems (ISCAS) 2011, Rio de Janeiro, Brazil, 15 May 2011 - 18 May 2011, 1149-1162.

Abstract

People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.

Abstract

People rarely put in their papers the things that didn't work, the mistakes they made, and how they found out what went wrong. Such confessions can help others learn how to avoid similar mistakes. Twenty-six confessions were collected to form the bulk of this paper. Themes that arise are errors that result from not understanding the limitations of simulation tools in modeling physical reality, chip verification errors that result from lack of clear communication between designers, and projects that are considered in their own isolated environment of technical challenges rather than the broader context of their environment or application.

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Additional indexing

Item Type:Conference or Workshop Item (Paper), refereed, original work
Communities & Collections:07 Faculty of Science > Institute of Neuroinformatics
Dewey Decimal Classification:570 Life sciences; biology
Language:English
Event End Date:18 May 2011
Deposited On:09 Mar 2012 14:16
Last Modified:23 Jul 2018 07:19
Publisher:IEEE
Series Name:IEEE International Symposium on Circuits and Systems proceedings
Number of Pages:13
ISSN:0271-4302
ISBN:978-1-424-49473-6
OA Status:Closed
Publisher DOI:https://doi.org/10.1109/ISCAS.2011.5937774

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