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Temperature-dependence of detection efficiency in NbN and TaN SNSPD


Engel, Andreas; Inderbitzin, Kevin; Schilling, Andreas; Lusche, Robert; Semenov, Alexei; Hübers, Heinz-Wilhelm; Henrich, Dagmar; Hofherr, Matthias; Il'in, Konstantin; Siegel, Michael (2013). Temperature-dependence of detection efficiency in NbN and TaN SNSPD. IEEE Transactions on Applied Superconductivity, 23(3):2300505.

Abstract

We present systematic measurements of the temperature dependence of detection efficiencies in TaN and NbN superconducting nanowire single-photon detectors. We have observed a clear increase of the cut-off wavelength with decreasing temperature that we can qualitatively describe with a temperature-dependent diffusion coefficient of the quasi-particles created after photon absorption. Furthermore, the detection efficiency at wavelengths shorter than the cut-off wavelength as well as at longer wavelengths exhibit distinct temperature dependencies. The underlying causes and possible consequences for microscopic detection models are discussed.

Abstract

We present systematic measurements of the temperature dependence of detection efficiencies in TaN and NbN superconducting nanowire single-photon detectors. We have observed a clear increase of the cut-off wavelength with decreasing temperature that we can qualitatively describe with a temperature-dependent diffusion coefficient of the quasi-particles created after photon absorption. Furthermore, the detection efficiency at wavelengths shorter than the cut-off wavelength as well as at longer wavelengths exhibit distinct temperature dependencies. The underlying causes and possible consequences for microscopic detection models are discussed.

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Additional indexing

Item Type:Journal Article, not_refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Scopus Subject Areas:Physical Sciences > Electronic, Optical and Magnetic Materials
Physical Sciences > Condensed Matter Physics
Physical Sciences > Electrical and Electronic Engineering
Language:English
Date:2013
Deposited On:25 Mar 2013 08:30
Last Modified:24 Jan 2022 00:02
Publisher:Institute of Electrical and Electronics Engineers
ISSN:1051-8223
OA Status:Closed
Publisher DOI:https://doi.org/10.1109/TASC.2013.2239345