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Resonant photoelectron diffraction with circularly polarized light

Morscher, M; Nolting, F; Brugger, T; Greber, T (2011). Resonant photoelectron diffraction with circularly polarized light. Physical Review. B, Condensed Matter and Materials Physics, 84(14):140406(R).

Abstract

The atomic and magnetic structure of surfaces and interfaces can be determined by angle-scanned resonant x-ray photoelectron diffraction. For the case of magnetized nickel the resonant L2 excitation with circularly polarized light yields electrons with a dichroic signature from which the dipolar part may be retrieved. The dichroic dipoles in the electron emission patterns rotate by distinct angles, which indicates different electron source waves with angular momenta parallel or antiparallel to those of the photons. For precise determination of the magnetization direction, the asymmetry between electron diffraction patterns as excited by left and right circularly polarized light has to be used.

©2011 American Physical Society

Additional indexing

Item Type:Journal Article, refereed, original work
Communities & Collections:07 Faculty of Science > Physics Institute
Dewey Decimal Classification:530 Physics
Scopus Subject Areas:Physical Sciences > Electronic, Optical and Magnetic Materials
Physical Sciences > Condensed Matter Physics
Language:English
Date:2011
Deposited On:14 Jan 2012 19:57
Last Modified:06 Sep 2024 01:38
Publisher:American Physical Society
ISSN:1098-0121
OA Status:Green
Publisher DOI:https://doi.org/10.1103/PhysRevB.84.140406
Related URLs:http://arxiv.org/abs/1103.4280

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